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2025-09Ai-enabled Intelligent VNA: How Does Deep Learning Reshape the Boundaries of Automation and Accuracy in RF Testing
Vector network analyzers (Vnas), as the "gold standard" for RF testing, are undergoing a paradigm shift from being dominated by traditional hardware to being deeply integrated with AI. Deep learning technology has enhanced the testing accuracy of VNA to the sub-microsecond level by reconstructing core links such as error correction, dynamic calibration, and defect identification. At the same time, it has increased the efficiency of automated testing by more than 300%, redefining the boundaries b View details
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2022-12From Schematic Diagram to PCB: Closed-loop Control Method for EMC Full-Process Design of High-Speed Digital Circuits
High-speed digital circuits are evolving towards ultra-high speeds such as 56Gbps PAM4 and 112Gbps NRZ. Electromagnetic compatibility (EMC) issues have risen from an auxiliary design stage to a core factor determining the success or failure of a product. The traditional serial mode of "design - test - rectification" is difficult to meet the development requirements of high-end products such as AI servers and 800G optical modules due to its long cycle and high cost. This paper proposes a full-pro View details21
2021-06
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